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For electronic components and sub-assemblies (ESAs), the core tests under ECE R10 include:
| Test Type | Description | Reference Standard |
|---|---|---|
| Radiated Emissions | Measures electromagnetic energy radiated by the product (broadband and narrowband) in a shielded anechoic chamber | CISPR 25 |
| Conducted Emissions | Measures electromagnetic disturbances conducted along power supply and signal lines | CISPR 25 |
| Broadband Emission | Measures interference from sources with continuous frequency spectra (e.g., motors, ignition systems) | CISPR 25 |
| Narrowband Emission | Measures interference from sources with discrete frequency spectra (e.g., microprocessors, oscillators) | CISPR 25 |
| Test Type | Description | Reference Standard |
|---|---|---|
| Radiated Immunity | Tests the product's ability to withstand external radio frequency (RF) fields | ISO 11452-2 (Absorber Chamber) |
| Bulk Current Injection (BCI) | Injects RF currents directly onto wiring harnesses to simulate radiated fields | ISO 11452-4 |
| TEM Cell Testing | Uses a transverse electromagnetic mode cell for radiated immunity testing | ISO 11452-3 |
| Stripline Testing | Alternative method for radiated immunity using a stripline setup | ISO 11452-5 |
| Transient Immunity | Simulates power supply line disturbances (e.g., load dump, jump start, voltage dips) using ISO 7637-2 pulse testing | ISO 7637-2 |
| Electrostatic Discharge (ESD) | Tests robustness against ESD events during handling, installation, and operation | ISO 10605 |